Published April 21, 2011
| Version v1
Journal article
The SUPERB silicon vertex tracker
Creators
- 1. INFN-Pisa and Universita di Pisa (Italy)
- 2. Scuola Normale Superiore and INFN-Pisa (Italy)
Description
The SUPERB asymmetric e+e- collider, to be built near the INFN National Frascati Laboratory in Italy, has been designed to deliver a luminosity greater than 1036 cm-2 s-1 with moderate beam currents, allowing precision measurements in the flavour sector sensitive to New Physics. The conceptual design of the Silicon Vertex Tracker for the SUPERB Detector is presented, based on double-sided silicon strip detectors for the outer layers, with the addition of an innermost Layer 0 close to the interaction point, with low material budget and capable of sustaining a background rate of several MHz/cm2.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2010.04.104Additional details
Identifiers
- DOI
- 10.1016/j.nima.2010.04.104;
- PII
- S0168-9002(10)00958-7;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 636
- Journal Issue
- 1,Suppl
- Journal Page Range
- p. S168-S172
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 7. international 'Hiroshima' symposium on the development and application of semiconductor tracking detectors
- Acronym
- HSTD7 Hiroshima
- Dates
- 29 Aug - 1 Sep 2009
- Place
- Hiroshima (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43054055
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM CURRENTS; DESIGN; FLAVOR MODEL; LUMINOSITY; POSITRONS; SI SEMICONDUCTOR DETECTORS
- Descriptors DEC
- ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; COMPOSITE MODELS; CURRENTS; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MATHEMATICAL MODELS; MATTER; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PARTICLE MODELS; PHYSICAL PROPERTIES; QUARK MODEL; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.