Published 1997 | Version v1
Journal article Metadata-only

Electron radiation effects on surface of lead silicate glass

Creators

  • 1. Texas Univ., El Paso, TX (United States). Mater. Res. Inst.
  • 2. Texas Univ., El Paso, TX (United States). Dept. of Physics
  • 3. Academia Sinica, Shanghai, SH (China). Shanghai Inst. of Optics and Fine Mechanics

Description

Electron radiation-induced changes in the microstructure of lead silicate glass were investigated in situ in an ultra-high vacuum (UHV) environment by X-ray photoelectron spectroscopy (XPS). Permanent metallic lead formation results from bond breaking and nucleation were observed. Bimodal distribution of the oxygen XPS signal, caused by bridging and nonbridging oxygens, was monitored during the irradiation and relaxation. The segregation of metallic lead, the depletion of oxidized lead and silicon, plus the accumulation of oxygen on sample surface under electron irradiation were observed. However, total lead, silicon and oxygen including nonbridging oxygen restored to their original concentrations after 60 hour relaxation. Only metallic lead induced by the irradiation remained constant in the structure during relaxation. (orig.)

Additional details

Publishing Information

Journal Title
Materials Science Forum
Journal Volume
239-241
Journal Page Range
p. 603-606.
ISSN
0255-5476
CODEN
MSFOEP

Conference

Title
13. international conference on defects in insulating materials (ICDIM-13).
Dates
15-19 Jul 1996.
Place
Winston-Salem, NC (United States).

INIS

Country of Publication
Switzerland
Country of Input or Organization
Switzerland
INIS RN
28063655
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
GLASS; LEAD OXIDES; MICROSTRUCTURE; RADIATION EFFECTS; RELAXATION; SILICON OXIDES; SURFACE PROPERTIES; TIME DEPENDENCE; X-RAY SPECTROSCOPY
Descriptors DEC
CHALCOGENIDES; CRYSTAL STRUCTURE; LEAD COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; SILICON COMPOUNDS; SPECTROSCOPY