Published December 1988
| Version v1
Journal article
Evidence of an high temperature phase in the AgTlTe-HgTe system by X-ray diffraction in Guinier chambre
Description
X-ray diffraction analysis using the Guinier method was used for the study of an high temperature phase in the AgTlTe-HgTe system. The samples corresponding to 35,50,55,60 and 75 mole % HgTe were studied. Diffraction patterns of each experiment are shown and interpreted. (author)
Abstract (Portuguese)
A tecnica de difracao dos Raios X em camara de Guinier e utilizada para estudar uma fase alta temperatura no sistema AgTlTe-HgTe. As composicoes estudadas correspondem a 35, 50, 55, 60 e 75 mol% em HgTe. Os difratogramas de cada amostra sao apresentados e interpretados. (autor)Additional details
Additional titles
- Original title (French)
- Mise en evidence d'une phase haute temperature dans le systeme AgTlTe-HgTe par diffraction des rayons X en chambre de Guinier
Publishing Information
- Journal Title
- Semina (Londrina)
- Journal Volume
- 9
- Journal Issue
- 4
- Journal Page Range
- p. 180-184
- ISSN
- 0101-3742
- CODEN
- SMNADC
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 51096162
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- CHEMICAL COMPOSITION; P-TYPE CONDUCTORS; QUANTITATIVE CHEMICAL ANALYSIS; SILVER; TELLURIUM; TEMPERATURE RANGE 0400-1000 K; THALLIUM; X-RAY DIFFRACTION
- Descriptors DEC
- CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; ELEMENTS; MATERIALS; METALS; SCATTERING; SEMICONDUCTOR MATERIALS; SEMIMETALS; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Notes
- This record replaces 21048944