Published September 1, 2011
| Version v1
Journal article
Off-axis viewing of radiation emission by long wiggler sources
Creators
- 1. National Synchrotron Light Source (NSLS), Brookhaven National Laboratory, Upton, NY 11973 (United States)
Description
When high-brilliance radiation is needed for experiments, insertion device sources are generally viewed on-axis. Off-axis emission of flux can be prodigious especially from wiggler sources having large emission fans. The on-axis and off-axis radiation emission characteristics from insertion device sources have been calculated extensively and are well known, but experimental verifications of some characteristics, particularly those associated with off-axis emission, are relatively few. Here measurements of the flux spectrum and apparent source size are described, as a function of horizontal emission angle, from the former X25 hybrid wiggler at the National Synchrotron Light Source (NSLS).
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2010.12.245Additional details
Identifiers
- DOI
- 10.1016/j.nima.2010.12.245;
- PII
- S0168-9002(11)00015-5;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 649
- Journal Issue
- 1
- Journal Page Range
- p. 35-38
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 16. Pan-American national synchrotron radiation instrumentation conference
- Acronym
- SRI2010
- Dates
- 21-24 Sep 2010
- Place
- Argonne, IL (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44001609
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- EMISSION; EQUIPMENT; NSLS; RADIATION FLUX; SPECTRA; VERIFICATION
- Descriptors DEC
- RADIATION SOURCES; SYNCHROTRON RADIATION SOURCES
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.