X-ray magnetic circular dichroism photoemission electron microscopy of focused ion beam-induced magnetic patterns on iron–rhodium surfaces
Creators
- 1. Department of Materials Science, Osaka Prefecture University, 1-1 Gakuen-cho, Naka-ku, Sakai, Osaka 599-8531 (Japan)
- 2. Japan Synchrotron Radiation Research Institute, SPring-8, Sayo, Hyogo 679-5198 (Japan)
- 3. CREST-JST, Kawaguchi, Saitama 332-0012 (Japan)
- 4. Research Organization for the 21st Century, Osaka Prefecture University, 1-1 Gakuen-cho, Sakai, Osaka 599-8531 (Japan)
Description
Iron–rhodium (FeRh) thin films were irradiated with a 30 keV Ga ion beam using a focused ion beam system to produce micrometer scale ferromagnetic square dot arrays. Two-dimensional magnetic square dot arrays with dimensions of 30 × 30, 10 × 10, and 5 × 5 μm were successfully produced on the FeRh surface, which was confirmed by magnetic force microscopy. The results of photoemission electron microscopy combined with X-ray magnetic circular dichroism revealed that the magnetization of the magnetic square dots could be controlled by changing the amount of irradiation. The magnetic domain structure of the magnetic square dots with sides of 5–30 μm was found to be a single domain structure, which was possibly influenced by the interaction between ferromagnetic and antiferromagnetic interfaces
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2013.03.028Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2013.03.028;
- PII
- S0168-583X(13)00362-5;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 302
- Journal Page Range
- p. 51-54
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45065076
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANTIFERROMAGNETISM; ATOMIC FORCE MICROSCOPY; DOMAIN STRUCTURE; ELECTRON MICROSCOPY; GALLIUM IONS; ION BEAMS; IRRADIATION; KEV RANGE 10-100; MAGNETIC CIRCULAR DICHROISM; MAGNETIC FIELDS; PHOTOEMISSION; THIN FILMS; X RADIATION
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; DICHROISM; ELECTROMAGNETIC RADIATION; EMISSION; ENERGY RANGE; FILMS; IONIZING RADIATIONS; IONS; KEV RANGE; MAGNETISM; MICROSCOPY; RADIATIONS; SECONDARY EMISSION
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.