Published September 14, 2015 | Version v1
Journal article

Model of Ni-63 battery with realistic PIN structure

  • 1. School of Electrical and Computer Engineering, Georgia Institute of Technology, 777 Atlantic Drive NW, 30332-0250 Atlanta (United States)
  • 2. Georgia Tech Lorraine, Georgia Tech-C.N.R.S., UMI2958, 2-3 rue Marconi, 57070 Metz (France)
  • 3. Université de Lorraine, CentraleSupélec, LMOPS, EA 4423, 2 rue E. Belin, 57070 Metz (France)
  • 4. Laboratory for Photonics and Nanostructures, CNRS, Route de Nozay, 91460 Marcoussis (France)

Description

GaN, with its wide bandgap of 3.4 eV, has emerged as an efficient material for designing high-efficiency betavoltaic batteries. An important part of designing efficient betavoltaic batteries involves a good understanding of the full process, from the behavior of the nuclear material and the creation of electron-hole pairs all the way through the collection of photo-generated carriers. This paper presents a detailed model based on Monte Carlo and Silvaco for a GaN-based betavoltaic battery device, modeled after Ni-63 as an energy source. The accuracy of the model is verified by comparing it with experimental values obtained for a GaN-based p-i-n structure under scanning electron microscope illumination

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
118
Journal Issue
10
Journal Page Range
p. 105101-105101.6
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

Notes
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