Improved ionization sources and detection methods for analytical mass spectrometry

A new time-of-flight mass spectrometer (TOF-MS) has been developed for direct characterization of solid samples and fundamental studies. A N2 laser (λ = 337 nm) was used with the linear TOF-MS to study ion formation from various solid specimens. Improved techniques were incorporated for fast ion detection and data acquisition. For inorganic specimens the mass resolution was ∼ 2000 at m/z = 400, a considerable improvement over earlier reports for instruments using a linear ion optical path. The TOF-MS was designed specifically to permit investigation of the information available from the individual TOF scans. The approach is described and results are given for the LD-TOF-MS spectra of CsI and a superconducting sample, YBa2Cu3O7. Other improvements in laser excitation of specimens and detection methods for analytical mass spectrometry are also described