Published February 22, 1971
| Version v1
Patent
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Procedure for directly measuring the profile and concentration of an element in a material and the equipment used
Description
no abstract available
Availability note (English)
MF available from INIS under the Report Number.Files
4077197.pdf
Files
(297.3 kB)
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Additional details
Additional titles
- Original title (French)
- Procede de mesure directe du profil de la teneur en un element dans un materiau et dispositif correspondant
Publishing Information
- Imprint Pagination
- 9 p.
- IPC:
- Int. Cl. G01n23/00.
- IPC
- Int. Cl. G01n23/00.
- Patent number
- FR patent document 2127065/D/
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 4077197
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DEPTH; ION EMISSION; ION PROBES; PROBES; QUANTITATIVE CHEMICAL ANALYSIS; SECONDARY EMISSION; SPUTTERING; SURFACES; TRACE AMOUNTS
- Descriptors DEC
- CHEMICAL ANALYSIS; DIMENSIONS; EMISSION