Published 1995 | Version v1
Report

Broadband short pulse measurement by autocorrelation with a sum-frequency generation set-up

  • 1. LURE, Orsay (France)

Description

Previous spectral and laser pulse length measurements carried out on the CLIO FEL at wavelength λ=8.5 μm suggested that very short light pulses could be generated, about 500 fs wide (FWHM). For these measurements a Michelson interferometer with a Te crystal, as a non-linear detector, was used as a second order autocorrelation device. More recent measurements in similar conditions have confirmed that the laser pulses observed are indeed single: they are not followed by other pulses distant by the slippage length Nλ. As the single micropulse length is likely to depend on the slippage, more measurements at different wavelengths would be useful. This is not directly possible with our actual interferometer set-up, based on a phase-matched non-linear crystal. However, we can use the broadband non-linear medium provided by one of our users' experiments: Sum-Frequency Generation over surfaces. With such autocorrelation set-up, interference fringes are no more visible, but this is largely compensated by the frequency range provided. First tests at 8 μm have already been performed to validate the technic, leading to results similar to those obtained with our previous Michelson set-up

Additional details

Publishing Information

Imprint Title
17th international free electron laser conference and 2nd international FEL users' workshop. Program and abstracts
Imprint Pagination
300 p.
Journal Page Range
p. Tu3.61.
Report number
BNL--61982-Absts

Conference

Title
17. international free electron laser conference; 2. international FEL users' workshop.
Dates
21-25 Aug 1995.
Place
New York, NY (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
27062750
Subject category
S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
FREE ELECTRON LASERS; FREQUENCY MEASUREMENT; MEASURING METHODS; MICHELSON INTERFEROMETER; PULSE TECHNIQUES; PULSES
Descriptors DEC
AMPLIFIERS; EQUIPMENT; INTERFEROMETERS; LASERS; MEASURING INSTRUMENTS

Optional Information

Secondary number(s)
CONF-9508156--Absts.