Published October 1, 2017 | Version v1
Journal article Metadata-only

Lorentz microscopy methods for magnetic domain structure study

Creators

  • 1. Institute of Physics, Russian Academy of Sciences, Siberian Branch, Krasnoyarsk 660036 (Russian Federation)
  • 2. Siberian Federal University, Krasnoyarsk 660041 (Russian Federation)
  • 3. Reshetnev Siberian State University of Science and Technology, Krasnoyarsk 660014 (Russian Federation)

Description

The capabilities of transmission electron microscope Hitachi HT7700 for magnetic domain structure (MDS) study of thin films using Lorentz transmission electron microscopy (LTEM) methods is discussed. Two methods of magnetic domain structure study (defocus method and aperture shift method, including low-angle electron diffraction (LAED)) in thin magnetic films were examined (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/255/1/012015

Additional details

Identifiers

DOI
10.1088/1757-899X/255/1/012015;

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
255
Journal Issue
1
Journal Page Range
[7 p.]
ISSN
1757-899X

Conference

Title
20. International scientific conference 'Reshetnev Readings'
Dates
9-12 Nov 2016
Place
Krasnoyarsk (Russian Federation)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
50057456
Subject category
S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
APERTURES; DOMAIN STRUCTURE; ELECTRON DIFFRACTION; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; FILMS; MICROSCOPY; OPENINGS; SCATTERING