Published July 12, 2001 | Version v1
Journal article

Electrostatic trap for keV ion beams

  • 1. Physics Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831 (United States)

Description

A reflecting ion beam electrostatic trap has been constructed and tested for the purpose of studying molecular ion physics. A trap of this type offers a large field-free region, wide mass range, and beam directionality that simplifies the detection of stored ions or breakup products. In our configuration, pulsed ions extracted from an ion source (5-10 μs) are accelerated to keV energies and magnetically analyzed before injection into the trap. After the ions center the trap, high-voltage electrostatic entrance and exit mirrors and Einzel lenses (operated by fast switches) cause the ions to oscillate between the mirrors in nearly parallel trajectories. Neutralized ions, detected by a channel plate located beyond the exit mirror, indicate the time dependence of the stored ion population. Voltages and pulsed timing of the beam and trap are controlled by computer (38 parameters). The computer can quickly find the optimum trapping conditions in successive fills using the detected neutral yield. Numerous atomic and molecular ions (energy of 1.3-3.0 keV and m<100 amu) have been stored with a beam capture efficiency up to 2%. The storage lifetime, limited by neutralizing collisions with background gas, is typically 2-5 sec at a pressure of 2x10-10 Torr

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
576
Journal Issue
1
Journal Page Range
p. 126-129
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
16. international conference on the application of accelerators in research and industry
Acronym
CAARI 2000
Dates
1-4 Nov 2000
Place
Denton, TX (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35090836
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S43: PARTICLE ACCELERATORS; S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM INJECTION; COMPUTERS; EFFICIENCY; ELECTRIC POTENTIAL; ELECTROSTATIC LENSES; ION BEAMS; ION SOURCES; KEV RANGE; MIRRORS; MOLECULAR IONS; PULSES; TIME DEPENDENCE; TRAPS; YIELDS
Descriptors DEC
BEAMS; CHARGED PARTICLES; ENERGY RANGE; IONS; LENSES

Optional Information

Notes
(c) 2001 American Institute of Physics.