Published July 2003
| Version v1
Journal article
Metal-semiconductor transition in non-stoichiometric double perovskite Sr2FexMo2-xO6
Description
The electronic transport properties of the ordered double perovskite oxides Sr2FexMo2-xO6 (0.8≤x≤1.5) have been investigated. In this system, the samples (x≥1.2) are semiconducting in the temperature range of 4.2≤T≤300 K. A metal-semiconductor transition occurs when x<1.2 and the transition temperature TMS decreases obviously as the Fe content decreases. Rietveld refinement of the X-ray powder diffraction profiles indicates that the crystal structure of the compounds Sr2FexMo2-xO6 changes from a tetragonal I4/mmm lattice to a cubic Fm3-barm lattice around x=1.2
Additional details
Identifiers
- DOI
- 10.1016/S0921-4526(03)00070-X;
- arXiv
- arXiv:cond-mat/0012502v1;
- PII
- S092145260300070X;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 334
- Journal Issue
- 3-4
- Journal Page Range
- p. 229-233
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36110145
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CUBIC LATTICES; ELECTRIC CONDUCTIVITY; IRON COMPOUNDS; METALS; MOLYBDENUM OXIDES; PHASE TRANSFORMATIONS; SEMICONDUCTOR MATERIALS; STOICHIOMETRY; STRONTIUM COMPOUNDS; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0000-0013 K; TEMPERATURE RANGE 0013-0065 K; TEMPERATURE RANGE 0065-0273 K; TEMPERATURE RANGE 0273-0400 K; TETRAGONAL LATTICES; TRANSITION TEMPERATURE; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRICAL PROPERTIES; ELEMENTS; MATERIALS; MOLYBDENUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; SCATTERING; TEMPERATURE RANGE; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.