Published August 26, 2013 | Version v1
Journal article Metadata-only

X-ray grating interferometry with a liquid-metal-jet source

Creators

  • 1. Institute for Biomedical Engineering, Swiss Federal Institute of Technology, Zurich (Switzerland)
  • 2. Paul Scherrer Institute, Villigen PSI (Switzerland)
  • 3. Biomedical and X-Ray Physics, KTH Royal Institute of Technology, Albanova, SE-10691 Stockholm (Sweden)

Description

A liquid-metal-jet X-ray tube is used in an X-ray phase-contrast microscope based on a Talbot type grating interferometer. With a focal spot size in the range of a few microns and a photon flux of ∼1012 photons/s×sr, the brightness of such a source is approximately one order of magnitude higher than for a conventional microfocus source. For comparison, a standard microfocus source was used with the same grating interferometer, showing significantly increased visibility for the liquid-metal-jet arrangement. Together with the increased flux, this results in improved signal-to-noise ratio

Additional details

Identifiers

DOI
10.1063/1.4819766;

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
103
Journal Issue
9
Journal Page Range
p. 091105-091105.3
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45039106
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
APPROXIMATIONS; BRIGHTNESS; COMPARATIVE EVALUATIONS; DIFFRACTION GRATINGS; INTERFEROMETERS; INTERFEROMETRY; JETS; LIQUID METALS; MICROSCOPES; MICROSCOPY; PHOTONS; SIGNAL-TO-NOISE RATIO; VISIBILITY; VISIBLE RADIATION; X RADIATION; X-RAY TUBES
Descriptors DEC
BOSONS; CALCULATION METHODS; DIMENSIONLESS NUMBERS; ELECTROMAGNETIC RADIATION; ELECTRON TUBES; ELEMENTARY PARTICLES; ELEMENTS; EQUIPMENT; EVALUATION; FLUIDS; IONIZING RADIATIONS; LIQUIDS; MASSLESS PARTICLES; MEASURING INSTRUMENTS; METALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; X-RAY EQUIPMENT

Optional Information

Notes
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