Published April 15, 1979 | Version v1
Journal article Metadata-only

Response of a Bi12SiO20 Pockels readout optical modulator to x rays

Creators

  • 1. Los Alamos Scientific Laboratory, Los Alamos, New Mexico 87545

Description

Response of a Pockels readout optical modulator to x rays has been measured. Sensitivity data and results of cursory imaging experiments suggest novel applications such as on-line radiography

Additional details

Publishing Information

Journal Title
Appl. Phys. Lett.
Journal Volume
34
Journal Issue
8
Series
Appl. Phys. Lett.
Journal Page Range
500-502
ISSN
0003-6951

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
10472738
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
BISMUTH COMPOUNDS; DATA; IMAGES; PHYSICAL RADIATION EFFECTS; SENSITIVITY; SILICATES; X RADIATION
Descriptors DEC
ELECTROMAGNETIC RADIATION; INFORMATION; IONIZING RADIATIONS; OXYGEN COMPOUNDS; RADIATION EFFECTS; RADIATIONS; SILICON COMPOUNDS