Published February 2, 2007 | Version v1
Journal article

Multiple Scattering Approach to Polarization Dependence of F K-Edge XANES Spectra for Highly Oriented Polytetrafluoroethylene (PTFE) Thin Film

  • 1. Graduate School of Sci. and Tech., Chiba Univ., Yayoicho 1-33, Inage-ku Chiba 263-8522 (Japan)

Description

The polarization dependence of F K-edge X-ray absorption near edge structure (XANES) spectra of highly-oriented thin-film of polytetrafluoroethylene (PTFE) has been analyzed by using multiple scattering theory. The spectra show clear polarization dependence due to the highly-oriented structure. The multiple scattering calculations reflects a local structure around an absorbing atom. The calculated results obtained by considering intermolecular-interactions are in good agreement with the observed polarization-dependence. We have also analyzed structural models of the radiation damaged PTFE films

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
882
Journal Issue
1
Journal Page Range
p. 514-516
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
13. international conference on X-ray absorption fine structure
Acronym
XAFS13
Dates
9-14 Jul 2006
Place
Stanford, CA (United States)

Optional Information

Notes
(c) 2007 American Institute of Physics