Published March 2007 | Version v1
Journal article

Effect of pressure on two-dimensional Heisenberg antiferromagnet Cu(HCOO)2.4H2O

  • 1. Department of Electronics, Faculty of Engineering, Kyushu Institute of Technology, Kitakyushu, Fukuoka 804-8550 (Japan)
  • 2. Graduate School of Science, Hiroshima University, Higashi-Hiroshima, Hiroshima 739-8526 (Japan)
  • 3. Faculty of Integrated Arts and Sciences, University of Tokushima, Tokushima 770-8502 (Japan)

Description

The effect of pressure on two-dimensional Heisenberg antiferromagnet Cu(HCOO)2.4H2O has been investigated through X-ray diffraction, susceptibility and magnetization curve measurements. The pressurization induces the paramagnetic behavior above 1.4 kbar. The paramagnetic component increases continuously with increasing pressure, and the antiferromagnetic ordering and field-induced phase transition vanish above 2.8 kbar. The X-ray diffraction pattern at 6.6 kbar is not that of Cu(HCOO)2.4H2O but Cu(HCOO)2.2H2O. Therefore, the pressurization induces the crystal structural change from Cu(HCOO)2.4H2O to Cu(HCOO)2.2H2O with dehydration

Additional details

Identifiers

DOI
10.1016/j.jmmm.2006.10.496;
PII
S0304-8853(06)01721-5;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
310
Journal Issue
2
Journal Page Range
p. e566-e568
ISSN
0304-8853
CODEN
JMMMDC

Conference

Title
17. international conference on magnetism
Dates
20-25 Aug 2006
Place
Kyoto (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39029854
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANTIFERROMAGNETIC MATERIALS; ANTIFERROMAGNETISM; COPPER COMPOUNDS; CRYSTALS; DEHYDRATION; MAGNETIZATION; PARAMAGNETISM; PHASE TRANSFORMATIONS; PRESSURIZATION; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; MAGNETIC MATERIALS; MAGNETISM; MATERIALS; SCATTERING; TRANSITION ELEMENT COMPOUNDS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.