Published March 2007
| Version v1
Journal article
Effect of pressure on two-dimensional Heisenberg antiferromagnet Cu(HCOO)2.4H2O
Creators
- 1. Department of Electronics, Faculty of Engineering, Kyushu Institute of Technology, Kitakyushu, Fukuoka 804-8550 (Japan)
- 2. Graduate School of Science, Hiroshima University, Higashi-Hiroshima, Hiroshima 739-8526 (Japan)
- 3. Faculty of Integrated Arts and Sciences, University of Tokushima, Tokushima 770-8502 (Japan)
Description
The effect of pressure on two-dimensional Heisenberg antiferromagnet Cu(HCOO)2.4H2O has been investigated through X-ray diffraction, susceptibility and magnetization curve measurements. The pressurization induces the paramagnetic behavior above 1.4 kbar. The paramagnetic component increases continuously with increasing pressure, and the antiferromagnetic ordering and field-induced phase transition vanish above 2.8 kbar. The X-ray diffraction pattern at 6.6 kbar is not that of Cu(HCOO)2.4H2O but Cu(HCOO)2.2H2O. Therefore, the pressurization induces the crystal structural change from Cu(HCOO)2.4H2O to Cu(HCOO)2.2H2O with dehydration
Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2006.10.496;
- PII
- S0304-8853(06)01721-5;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 310
- Journal Issue
- 2
- Journal Page Range
- p. e566-e568
- ISSN
- 0304-8853
- CODEN
- JMMMDC
Conference
- Title
- 17. international conference on magnetism
- Dates
- 20-25 Aug 2006
- Place
- Kyoto (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39029854
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANTIFERROMAGNETIC MATERIALS; ANTIFERROMAGNETISM; COPPER COMPOUNDS; CRYSTALS; DEHYDRATION; MAGNETIZATION; PARAMAGNETISM; PHASE TRANSFORMATIONS; PRESSURIZATION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; MAGNETIC MATERIALS; MAGNETISM; MATERIALS; SCATTERING; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.