Published January 1989 | Version v1
Journal article

X-ray emission from electron capture into 2.4-9 keV/amu O7+, O8+, Ne8+ and Ne9+

  • 1. Aarhus Univ. (Denmark). Inst. of Physics
  • 2. Institut za Nuklearne Nauke Boris Kidric, Belgrade (Yugoslavia). FOM-Instituut voor Atoom-en Molecuulfysica, Amsterdam (Netherlands)
  • 3. Rijksuniversiteit Groningen (Netherlands). Kernfysisch Versneller Inst.

Description

With a curved crystal spectrometer x rays emitted from ions from an ECR ion source have been measured after they have passed a gas, from which they capture electrons to specific states. High resolution results are presented for 96 keV 18 O8+; 75 keV O7+, 108 keV Ne9+ and for 48, 107 and 160 keV Ne8+ on He and H2 gas targets, and for 107 keV Ne8+ on Ne, Ar, O2 and CH4

Additional details

Publishing Information

Journal Title
Journal de Physique (Les Ulis), Colloque
Journal Volume
50
Journal Issue
C.1
Series
J. Phys. (Les Ulis), Colloq.
Journal Page Range
C1.379-C1.386
ISSN
0449-1947
CODEN
JPQCA

Conference

Title
International Conference on the physics of multiply charged ions and International workshop on E.C.R. ion sources.
Dates
12-16 Sep 1988.
Place
Grenoble (France).