Analysis of some ancient glass samples unearthed in Sichuan area by PIXE
- 1. Chinese Academy of Sciences, Shanghai (China). Shanghai Inst. of Optics and Fine Mechanics
- 2. Fudan Univ., Shanghai (China). Applied Ion Beam Physics Laboratory
- 3. The Chongqing Museum, Chongqing (China)
Description
Proton induced X-ray emission (PIXE) technique is an effective method for the chemical composition analysis of ancient glass samples without destruction. Chemical composition of the ancient glass samples dated from the Warring States Period (770-476 B.C.) to the Six Dynasties Period (220-589 A.D.), which were unearthed in Sichuan area, was quantitatively determined by the PIXE technique. The results show that the glass Bi (disc) and the glass eye beads of the Warring States Period all belong to the PbO-BaO-SiO2 system. According to the composition and shape, we infer that these glass Bi and eye beads were made in China. Whereas, the chemical compositions of the glass ear pendants and beads of the Six Dynasties Period are varied, including K2O-CaO-SiO2, K2O-SiO2 and other glass systems, Based on the obtained results and those from literatures, some questions related to the technical propagation of the ancient Chinese glass are discussed. (authors)
Additional details
Publishing Information
- Journal Title
- Nuclear Techniques
- Journal Volume
- 30
- Journal Issue
- 2
- Journal Page Range
- p. 119-124
- ISSN
- 0253-3219
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 39114830
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ARCHAEOLOGICAL SPECIMENS; BARIUM OXIDES; CALCIUM OXIDES; CHEMICAL COMPOSITION; CHINA; GLASS; LEAD OXIDES; NONDESTRUCTIVE ANALYSIS; PIXE ANALYSIS; POTASSIUM OXIDES; SHAPE; SILICA; SILICON OXIDES
- Descriptors DEC
- ALKALI METAL COMPOUNDS; ALKALINE EARTH METAL COMPOUNDS; ASIA; BARIUM COMPOUNDS; CALCIUM COMPOUNDS; CHALCOGENIDES; CHEMICAL ANALYSIS; LEAD COMPOUNDS; MINERALS; NONDESTRUCTIVE ANALYSIS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; POTASSIUM COMPOUNDS; SILICON COMPOUNDS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 3 figs., 2 tabs., 17 refs.