Published July 8, 2002 | Version v1
Journal article

Fast electron transport in ultraintense laser pulse interaction with solid targets by rear-side self-radiation diagnostics

  • 1. Laboratoire pour l'Utilisation des Lasers Intenses, UMR7605, CNRS-CEA-Universite Paris VI-Ecole Polytechnique, 91128 Palaiseau (France)
  • 2. Commissariat a l'Energie Atomique, 91680 Bruyeres-le-Chatel (France)
  • 3. Dipartimento di Fisica G. Ochialini, Universita degli Studi di Milano-Bicocca and INFM, P.za Scienza 3, 20126 Milan (Italy)
  • 4. University of Essex, Colchester CO4 3SQ (United Kingdom)

Description

We report on rear-side optical self-emission results from ultraintense laser pulse interactions with solid targets. A prompt emission associated with a narrow electron jet has been observed up to aluminum target thicknesses of 400 μm with a typical spreading half-angle of 17 degree sign . The quantitative results on the emitted energy are consistent with models where the optical emission is due to transition radiation of electrons reaching the back surface of the target or due to a synchrotron-type radiation of electrons pulled back to the target. These models associated with transport simulation results give an indication of a temperature of a few hundred keV for the fast-electron population

Additional details

Publishing Information

Journal Title
Physical Review Letters
Journal Volume
89
Journal Issue
2
Journal Page Range
p. 025001-025001.4
ISSN
0031-9007
CODEN
PRLTAO

Optional Information

Notes
(c) 2002 The American Physical Society