Morphological stability of Pt coatings deposited on Cr substrates
- 1. Centre for Materials Engineering, Department of Mechanical Engineering, University of Cape Town, Rondebosch 7701 (South Africa)
- 2. Macquarie University, NSW 2109 (Australia)
- 3. iThemba LABS/National Research Foundation, P.O. Box 722, Somerset West 7129 (South Africa)
Description
The morphological stability of coatings is an important factor for the reliability of microelectronic devices operating at elevated temperature. The focus of this work was to characterise and explain the coating degradation mechanisms of Pt–Cr coatings and thereby to find ways of extending their operating temperature range. Platinum coatings on chromium are shown to be morphologically stable up to 800 °C; at higher temperatures degradation is observed. Scanning electron microscopy of coated specimens with a systematic variation in both coating thickness and annealing temperature shows that significant grain-boundary grooving and agglomeration can occur. This has important implications for the reliability of microelectronic devices operating at elevated temperatures. - Highlights: • Degradation mechanisms for Pt–Cr coatings at high temperatures have been investigated. • A model for coating morphology degradation is proposed. • Operating temperature ranges for uniform and reliable Pt–Cr coatings are shown.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2016.02.042Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2016.02.042;
- PII
- S0040-6090(16)00141-3;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 604
- Journal Page Range
- p. 7-11
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48020888
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AGGLOMERATION; ANNEALING; CHROMIUM; COATINGS; GRAIN BOUNDARIES; MICROELECTRONIC CIRCUITS; MORPHOLOGY; PHASE STABILITY; PLATINUM; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; TEMPERATURE DEPENDENCE
- Descriptors DEC
- ELECTRON MICROSCOPY; ELECTRONIC CIRCUITS; ELEMENTS; HEAT TREATMENTS; METALS; MICROSCOPY; MICROSTRUCTURE; PLATINUM METALS; STABILITY; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.