Optical properties of plastic scintillators coated with copper, aluminum and silver by magnetron sputtering
Creators
- 1. Key Laboratory of Ion Beam Bioengineering, Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031 (China)
- 2. Department of Physics and Materials Science, City University of Hong Kong, Tat Chee Avenue, Kowloon (Hong Kong)
- 3. Hubei Province Key Laboratory of Ceramics and Refractories, College of Materials and Metallurgy, Wuhan University of Science and Technology, Wuhan 430081 (China)
Description
Copper, aluminum, and silver thin films are fabricated on plastic scintillators by magnetron sputtering to improve the optical properties. The film morphology is measured by contact mode atomic force microscopy. The optical properties are determined by UV/visible spectrophotometry as well as a single-particle microbeam with proton energy of 2 MeV. Our theoretical analysis suggests a 10.28% increase in the collection efficiency compared to the uncoated plastic scintillator. The improvement in the optical properties is investigated experimentally and the Monte Carlo program SRIM 2008 is employed to investigate the influence of the metal film thickness on the ion stopping and scattering in the materials. Our study suggests that deposition of thin reflecting Cu, Al, and Ag films improves the energy and space resolution of scintillator-based particle spectrometers.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2009.01.011Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2009.01.011;
- PII
- S0040-6090(09)00026-1;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 517
- Journal Issue
- 15
- Journal Page Range
- p. 4443-4447
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42042868
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM; ATOMIC FORCE MICROSCOPY; COPPER; DEPOSITION; EFFICIENCY; MAGNETRONS; MEV RANGE 01-10; MONTE CARLO METHOD; MORPHOLOGY; OPTICAL PROPERTIES; PLASTIC SCINTILLATORS; SCATTERING; SILVER; SPECTROMETERS; SPECTROPHOTOMETRY; SPUTTERING; THIN FILMS
- Descriptors DEC
- CALCULATION METHODS; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; ENERGY RANGE; EQUIPMENT; FILMS; MEASURING INSTRUMENTS; METALS; MEV RANGE; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; PHOSPHORS; PHYSICAL PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.