Indentation strength of silicon nitride ceramics processed by spark plasma sintering technique
- 1. Tohoku University, 6-6-11, Aza-Aoba, Aramaki, Aobaku, Sendai 980-8579 (Japan)
- 2. Université de Lyon, INSA-Lyon, MATEIS CNRS UMR5510, F-69621 Villeurbanne (France)
- 3. Université de Lyon, INSA-Lyon, LaMCoS CNRS UMR5259, F-69621 Villeurbanne (France)
Description
We investigated the influence of the microstructure on the true stress–strain curve of silicon nitride based ceramics. The materials were processed by spark plasma sintering technique. Si3N4 with fine, average and coarse microstructures were obtained. Load versus displacement curves (P–h) were obtained by means of instrumented indentation technique using diamond coni-spherical tip. The experimental data were coupled with a minimization method based on the Levenberg–Marquardt algorithm and the non-linear part of the mechanical response was identified. Based on the obtained stress–strain curves, rolling contact simulations were performed. In addition, the nature of Hertzian contact damage was examined in the material with coarse microstructure using diamond indenters of radii 0.2 and 1 mm. The surface damage was observed under optical microscopy while Focused Ion Beam Sectioning technique permitted to image the subsurface damage. An evident size effect was noticed: fracture consisting of classical ring cracks dominated at large scale while distributed microcracks beneath the indent dominated at small scale
Availability note (English)
Available from http://dx.doi.org/10.1016/j.msea.2015.07.053Additional details
Identifiers
- DOI
- 10.1016/j.msea.2015.07.053;
- PII
- S0921-5093(15)30205-7;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 644
- Journal Page Range
- p. 159-170
- ISSN
- 0921-5093
- CODEN
- MSAPE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47049325
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CERAMICS; CRACKS; DIAMONDS; FRACTURES; ION BEAMS; MICROSTRUCTURE; OPTICAL MICROSCOPY; PHASE DIAGRAMS; PLASMA; ROLLING; SILICON NITRIDES; SINTERING; STRAINS; STRESSES; SURFACES
- Descriptors DEC
- BEAMS; CARBON; DIAGRAMS; ELEMENTS; FABRICATION; FAILURES; INFORMATION; MATERIALS WORKING; MICROSCOPY; MINERALS; NITRIDES; NITROGEN COMPOUNDS; NONMETALS; PNICTIDES; SILICON COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.