Published January 1, 2011 | Version v1
Journal article

Soft X-ray angle-resolved photoemission study of YbCu2Ge2

  • 1. Condensed Matter Science Division, Japan Atomic Energy Agency, SPring-8, Sayo, Hyogo 679-5148 (Japan)
  • 2. Division of Materials Physics, Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka 560-8531 (Japan)
  • 3. Department of Physics, Graduate School of Science, Osaka University, Toyonaka, Osaka 560-0043 (Japan)
  • 4. Advanced Science Research Center, Japan Atomic Energy Agency, Tokai, Ibaraki 319-1195 (Japan)

Description

Soft X-ray photoemission spectroscopies have been performed on YbCu2Ge2, which is thought to be a Yb divalent system, to investigate its bulk electronic structure including Yb 4f electrons. Small but finite Yb3+ multiplet peaks were found at 6-12 eV in the angle-integrated spectrum, suggesting that it is a valence fluctuation compound. An 'anti-crossing' Yb 4f bands with conduction bands were observed in the angle-resolved spectrum. This is the evidence that the Yb 4f electrons form a band state through the hybridization with Ge 4p and Cu 3d electrons.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/273/1/012067

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
273
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
International conference on strongly correlated electron systems
Acronym
SCES 2010
Dates
27 Jun - 2 Jul 2010
Place
Santa Fe, NM (United States)