Published 1977 | Version v1
Miscellaneous Metadata-only

On the use of X-ray semiconductor detectors for express analysis of large ore masses

Creators

Description

Questions of the application of the roentgenoradiometric method in rapid analysis of large ore masses are considered. The possibilities for the utilization of scintillation, proportional, and semiconductor detectors for this purpose are analyzed. The results of measurements over a large ore surface with the use of various sources and detectors are presented. The sensitivity thresholds obtained are tabulated

Additional details

Additional titles

Original title (Russian)
Об использовании рентгеновских PPD при экспресс-анализе больших масс руды

Publishing Information

Imprint Title
Nuclear instrument making
Journal Issue
no. 34-35
Series
Voprosy atomnoj nauki i tekhniki.
Journal Page Range
p. 101-106.

INIS

Country of Publication
USSR
Country of Input or Organization
USSR
INIS RN
9414380
Subject category
S58: GEOSCIENCES;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
ORES; PROPORTIONAL COUNTERS; RADIOMETRIC ANALYSIS; SCINTILLATION COUNTERS; SEMICONDUCTOR DETECTORS; SENSITIVITY; X RADIATION
Descriptors DEC
CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; QUANTITATIVE CHEMICAL ANALYSIS; RADIATION DETECTORS; RADIATIONS

Optional Information

Notes
5 refs.; 1 fig.; 1 table. Imprint:Yadernoe priborostroenie.