Superparamagnetic Co36C64 granular film
Creators
Description
Nanocomposite Co-C thin films of about 15 nm thick were prepared by pulsed filtered vacuum arc deposition. The films were characterized by X-ray photoelectron spectroscopy, non-Rutherford backscattering spectrometry, X-ray diffraction, and magnetic force microscopy. The as-deposited films were amorphous. After annealing at 350 deg. C for 1 h in vacuum (<10-3 Pa), the films were found to consist of nanocrystalline Co grains encapsulated in carbon. The superparamagnetism of the annealed Co36C64 film was demonstrated by the measurement of DC susceptibility and magnetic hysteresis using a SQUID magnetometer. The superparamagnetic relaxation blocking temperature was marked to be about 12 K by the peak of the zero-field-cooled magnetization under a field of 100 Oe. The magnetic properties of these annealed granular Co-C films transform from superparamagnetism to ferromagnetism when the Co concentration increases
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2003.09.244;
- PII
- S0921452603008962;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 344
- Journal Issue
- 1-4
- Journal Page Range
- p. 88-92
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37000840
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANNEALING; CARBON; COBALT CARBIDES; CRYSTALS; DEPOSITION; DOMAIN STRUCTURE; FERROMAGNETISM; HYSTERESIS; MAGNETIC FIELDS; MAGNETIC PROPERTIES; MAGNETIZATION; NANOSTRUCTURES; RELAXATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SQUID DEVICES; SUPERPARAMAGNETISM; THIN FILMS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; COBALT COMPOUNDS; COHERENT SCATTERING; DIFFRACTION; ELECTRON SPECTROSCOPY; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; FLUXMETERS; HEAT TREATMENTS; MAGNETISM; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; NONMETALS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; SCATTERING; SPECTROSCOPY; SUPERCONDUCTING DEVICES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.