Surface-enhanced Raman scattering sensing on black silicon
Creators
- 1. The Australian National Fabrication Facility-ANFF, Victoria node, Faculty of Engineering and Industrial Sciences, Swinburne University of Technology, Hawthorn, VIC (Australia)
- 2. Centre for Micro-Photonics and Industrial Research Institute Swinburne, Faculty of Engineering and Industrial Sciences, Swinburne University of Technology, Hawthorn, VIC (Australia)
- 3. Melbourne Centre for Nanofabrication, Clayton, VIC (Australia)
Description
Reactive ion etching was used to fabricate black-Si over the entire surface area of 4-inch Si wafers. After 20 min of the plasma treatment, surface reflection well below 2% was achieved over the 300-1000 nm spectral range. The spikes of the black-Si substrates were coated by gold, resulting in an island film for surface-enhanced Raman scattering (SERS) sensing. A detection limit of 1 x 10-6 M (at count rate > 102 s-1. mW-1) was achieved for rhodamine 6G in aqueous solution when drop cast onto a ∝ 100-nm-thick Au coating. The sensitivity increases for thicker coatings. A mixed mobile-on-immobile platform for SERS sensing is introduced by using dog-bone Au nanoparticles on the Au/black-Si substrate. The SERS intensity shows a non-linear dependence on the solid angle (numerical aperture of excitation/collection optics) for a thick gold coating that exhibits a 10 times higher enhancement. This shows promise for augmented sensitivity in SERS applications. (copyright 2013 by WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)
Availability note (English)
Available from: http://dx.doi.org/10.1002/andp.201300035Additional details
Identifiers
Publishing Information
- Journal Title
- Annalen der Physik (Leipzig)
- Journal Volume
- 525
- Journal Issue
- 12
- Journal Page Range
- p. 907-914
- ISSN
- 0003-3804
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 45021825
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AQUEOUS SOLUTIONS; DROPLETS; ETCHING; GOLD; NANOSTRUCTURES; NONLINEAR PROBLEMS; PARTICLE SIZE; PLASMA; RAMAN SPECTRA; REFLECTIVITY; SCANNING ELECTRON MICROSCOPY; SENSITIVITY; SENSORS; SILICON; SUBSTRATES; SURFACE TREATMENTS; SURFACES; THICKNESS
- Descriptors DEC
- DIMENSIONS; DISPERSIONS; ELECTRON MICROSCOPY; ELEMENTS; HOMOGENEOUS MIXTURES; METALS; MICROSCOPY; MIXTURES; OPTICAL PROPERTIES; PARTICLES; PHYSICAL PROPERTIES; SEMIMETALS; SIZE; SOLUTIONS; SPECTRA; SURFACE FINISHING; SURFACE PROPERTIES; TRANSITION ELEMENTS