Published 1991
| Version v1
Miscellaneous
Quality control of indirect measure method for calibration of radioactive sources at a secondary standard dosimetry laboratory
Creators
- 1. Instituto de Radioprotecao e Dosimetria (IRD), Rio de Janeiro, RJ (Brazil)
Description
In this work, a quality control program is illustrated with data obtained by a calibration system with an indirect method provided with an hyperpure germanium detector, normalized by the data obtained in a 4 π β-γ system as a direct method, consisting of proportional counter in coincidence with a NaI(T1) detector, or by activity values of the standard sources, certified and calibrated in a primary laboratory. The results obtained, for activities ranging from 10 sup(3) to 10 sup(6)Bq and many radionuclides, show that the accuracy of the measurements performed in a period of 4 years was better than 2%. When only one radionuclide is used, such as sup(137)Cs, the accuracy during a period of 3 years, was better than 0,5%. (author)
Availability note (English)
Available from the Library of Comissao Nacional de Energia Nuclear, RJ, Brazil.Additional details
Additional titles
- Original title (Portuguese)
- Controle de qualidade de sistema de medida indireta para calibracao de fontes radioativas, num laboratorio de metrologia padrao secundario
Publishing Information
- Imprint Title
- Proceedings of the 1. Brazilian Meeting on Nuclear Applications - v.1
- Imprint Pagination
- 351 p.
- Journal Page Range
- p. 217-230.
Conference
- Title
- 1. Brazilian Meeting on Nuclear Applications.
- Original Conference Title
- 1. Encontro Nacional de Aplicacoes Nucleares
- Dates
- 27-30 May 1991.
- Place
- Recife, PE (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 22090603
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- CALIBRATION; CALIBRATION STANDARDS; GAMMA SPECTROSCOPY; HIGH-PURITY GE DETECTORS; QUALITY CONTROL; RADIATION SOURCES
- Descriptors DEC
- CONTROL; GE SEMICONDUCTOR DETECTORS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTROSCOPY; STANDARDS
Optional Information
- Notes
- Imprint:Anais do 1. Encontro Nacional de Aplicacoes Nucleares - v.1.