Published 1991 | Version v1
Miscellaneous

Quality control of indirect measure method for calibration of radioactive sources at a secondary standard dosimetry laboratory

  • 1. Instituto de Radioprotecao e Dosimetria (IRD), Rio de Janeiro, RJ (Brazil)

Description

In this work, a quality control program is illustrated with data obtained by a calibration system with an indirect method provided with an hyperpure germanium detector, normalized by the data obtained in a 4 π β-γ system as a direct method, consisting of proportional counter in coincidence with a NaI(T1) detector, or by activity values of the standard sources, certified and calibrated in a primary laboratory. The results obtained, for activities ranging from 10 sup(3) to 10 sup(6)Bq and many radionuclides, show that the accuracy of the measurements performed in a period of 4 years was better than 2%. When only one radionuclide is used, such as sup(137)Cs, the accuracy during a period of 3 years, was better than 0,5%. (author)

Availability note (English)

Available from the Library of Comissao Nacional de Energia Nuclear, RJ, Brazil.

Additional details

Additional titles

Original title (Portuguese)
Controle de qualidade de sistema de medida indireta para calibracao de fontes radioativas, num laboratorio de metrologia padrao secundario

Publishing Information

Imprint Title
Proceedings of the 1. Brazilian Meeting on Nuclear Applications - v.1
Imprint Pagination
351 p.
Journal Page Range
p. 217-230.

Conference

Title
1. Brazilian Meeting on Nuclear Applications.
Original Conference Title
1. Encontro Nacional de Aplicacoes Nucleares
Dates
27-30 May 1991.
Place
Recife, PE (Brazil).

INIS

Country of Publication
Brazil
Country of Input or Organization
Brazil
INIS RN
22090603
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
CALIBRATION; CALIBRATION STANDARDS; GAMMA SPECTROSCOPY; HIGH-PURITY GE DETECTORS; QUALITY CONTROL; RADIATION SOURCES
Descriptors DEC
CONTROL; GE SEMICONDUCTOR DETECTORS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTROSCOPY; STANDARDS

Optional Information

Notes
Imprint:Anais do 1. Encontro Nacional de Aplicacoes Nucleares - v.1.