Silicon carbide transistor structures as detectors of weakly ionizing radiation
Creators
- 1. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. Petersburg, 194021 (Russian Federation)
- 2. Linkoeping University, S-581 83 Linkoeping (Sweden)
Description
SiC-based nuclear radiation detectors figured prominently in the very first attempts of the 1960s to replace gas in ionization chambers with a more condensed semiconducting medium. However, the dynamics of improvement of SiC in those years was markedly inferior to the progress made in the development of competing materials. This study continues with the investigation of triode detector structures based on 'pure' SiC films. It is established that for weakly ionizing radiation (as also in the case of strongly ionizing alpha particles) the signal is amplified by no less than a factor of several tens. This allows SiC films with a thickness of about 10 μm to be used to detect penetrating radiation, e.g., X-rays, since the effective thickness of the films is on the order of hundreds of micrometers
Additional details
Identifiers
- DOI
- 10.1134/1.1538541;
Publishing Information
- Journal Title
- Semiconductors
- Journal Volume
- 37
- Journal Issue
- 1
- Journal Page Range
- p. 65-69
- ISSN
- 1063-7826
- CODEN
- SMICES
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35052809
- Subject category
- S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Numerical Data, Translation
- Descriptors DEI
- DESIGN; EXPERIMENTAL DATA; GAMMA RADIATION; IONIZING RADIATIONS; PHYSICAL RADIATION EFFECTS; SEMICONDUCTOR MATERIALS; SI SEMICONDUCTOR DETECTORS; SILICON CARBIDES; SUPERCONDUCTING DEVICES; TRANSISTORS; X RADIATION; X-RAY DETECTION
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; DATA; DETECTION; ELECTROMAGNETIC RADIATION; INFORMATION; IONIZING RADIATIONS; MATERIALS; MEASURING INSTRUMENTS; NUMERICAL DATA; RADIATION DETECTION; RADIATION DETECTORS; RADIATION EFFECTS; RADIATIONS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SILICON COMPOUNDS
Optional Information
- Notes
- Translated from Fizika i Tekhnika Poluprovodnikov, ISSN 0015-3222, 37, 65-69 (No. 1, 2003); (c) 2003 MAIK ''Nauka / Interperiodica''.