Published January 2003 | Version v1
Journal article

Silicon carbide transistor structures as detectors of weakly ionizing radiation

  • 1. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. Petersburg, 194021 (Russian Federation)
  • 2. Linkoeping University, S-581 83 Linkoeping (Sweden)

Description

SiC-based nuclear radiation detectors figured prominently in the very first attempts of the 1960s to replace gas in ionization chambers with a more condensed semiconducting medium. However, the dynamics of improvement of SiC in those years was markedly inferior to the progress made in the development of competing materials. This study continues with the investigation of triode detector structures based on 'pure' SiC films. It is established that for weakly ionizing radiation (as also in the case of strongly ionizing alpha particles) the signal is amplified by no less than a factor of several tens. This allows SiC films with a thickness of about 10 μm to be used to detect penetrating radiation, e.g., X-rays, since the effective thickness of the films is on the order of hundreds of micrometers

Additional details

Identifiers

Publishing Information

Journal Title
Semiconductors
Journal Volume
37
Journal Issue
1
Journal Page Range
p. 65-69
ISSN
1063-7826
CODEN
SMICES

Optional Information

Notes
Translated from Fizika i Tekhnika Poluprovodnikov, ISSN 0015-3222, 37, 65-69 (No. 1, 2003); (c) 2003 MAIK ''Nauka / Interperiodica''.