Published October 1, 2017 | Version v1
Journal article

Scanning probe microscopy in mineralogical studies: about origin of the observed roughness of natural silica-rich glasses

  • 1. Institute of Geology of Komi SC of Uralian Branch of RAS, Syktyvkar (Russian Federation)

Description

We have studied different mineralogical objects: natural glasses of impact (tektites, impactites) and volcanic (obsidians) origin, using atomic force microscopy, X-ray microanalysis, infrared and Raman spectroscopy. The spectroscopy showed the difference in the structure and chemical composition of the glasses of different origin. The analysis of the dependence of nanoscale heterogeneity of the glasses, revealed by the atomic force microscopy, on their structural and chemical features was carried out. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/256/1/012019

Additional details

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
256
Journal Issue
1
Journal Page Range
[7 p.]
ISSN
1757-899X

Conference

Title
International conference on scanning probe microscopy
Acronym
SPM-2017
Dates
27-30 Aug 2017
Place
Ekaterinburg (Russian Federation)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
50057466
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMIC FORCE MICROSCOPY; CHEMICAL COMPOSITION; GLASS; MICROANALYSIS; NANOSTRUCTURES; RAMAN SPECTROSCOPY; ROUGHNESS; SILICA; TEKTITES
Descriptors DEC
LASER SPECTROSCOPY; MICROSCOPY; MINERALS; OXIDE MINERALS; SPECTROSCOPY; SURFACE PROPERTIES