Published October 1, 2017
| Version v1
Journal article
Scanning probe microscopy in mineralogical studies: about origin of the observed roughness of natural silica-rich glasses
Creators
- 1. Institute of Geology of Komi SC of Uralian Branch of RAS, Syktyvkar (Russian Federation)
Description
We have studied different mineralogical objects: natural glasses of impact (tektites, impactites) and volcanic (obsidians) origin, using atomic force microscopy, X-ray microanalysis, infrared and Raman spectroscopy. The spectroscopy showed the difference in the structure and chemical composition of the glasses of different origin. The analysis of the dependence of nanoscale heterogeneity of the glasses, revealed by the atomic force microscopy, on their structural and chemical features was carried out. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/256/1/012019Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 256
- Journal Issue
- 1
- Journal Page Range
- [7 p.]
- ISSN
- 1757-899X
Conference
- Title
- International conference on scanning probe microscopy
- Acronym
- SPM-2017
- Dates
- 27-30 Aug 2017
- Place
- Ekaterinburg (Russian Federation)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50057466
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CHEMICAL COMPOSITION; GLASS; MICROANALYSIS; NANOSTRUCTURES; RAMAN SPECTROSCOPY; ROUGHNESS; SILICA; TEKTITES
- Descriptors DEC
- LASER SPECTROSCOPY; MICROSCOPY; MINERALS; OXIDE MINERALS; SPECTROSCOPY; SURFACE PROPERTIES