Published October 28, 2016
| Version v1
Journal article
Uncovering dispersion properties in semiconductor waveguides to study photon-pair generation
Creators
- 1. Institut für Experimentalphysik, Universität Innsbruck, Technikerstraße 25, 6020 Innsbruck (Austria)
- 2. Technische Physik, Universität Würzburg, Am Hubland, 97074 Würzburg (Germany)
Description
We investigate the dispersion properties of ridge Bragg-reflection waveguides to deduce their phasematching characteristics. These are crucial for exploiting them as sources of parametric down-conversion (PDC). In order to estimate the phasematching bandwidth we first determine the group refractive indices of the interacting modes via Fabry–Perot experiments in two distant wavelength regions. Second, by measuring the spectra of the emitted PDC photons, we gain access to their group index dispersion. Our results offer a simple approach for determining the PDC process parameters in the spectral domain, and provide important feedback for designing such sources, especially in the broadband case. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/27/43/434003Additional details
Identifiers
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 27
- Journal Issue
- 43
- Journal Page Range
- [7 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50039276
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- BRAGG REFLECTION; DISPERSIONS; EMISSION; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS; SPECTRA; WAVEGUIDES
- Descriptors DEC
- MATERIALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; REFLECTION