Published December 10, 1991
| Version v1
Journal article
Structural and magnetic properties of Al/Fe multilayers deposited by ion beam sputtering
- 1. U.S. Naval Research Lab., Washington, DC (United States)
- 2. Sachs/Freeman Associates, Inc., Landover, MD (United States)
Description
Al/Fe multilayers were deposited using an ion-assisted ion-beam sputtering technique. X-ray diffraction at high angles showed peaks corresponding to the aluminum f.c.c. phase with a lattice parameter equal to that of bulk aluminum. Peaks from the iron b.c.c. phase were observed and the lattice parameter based on these peaks was calculated to be 2.94 A. The absence of satellite peaks is attributed to the small grain size. The low angle diffraction pattern showed three orders of peaks. Investigation of the magnetic properties using a vibrating sample magnetometer and ferromagnetic resonance showed a moderately reduced moment for iron when compared with bulk iron. (orig.)
Additional details
Publishing Information
- Journal Title
- Surface and Coatings Technology
- Journal Volume
- 49
- Journal Issue
- 1-3
- Series
- Surf. Coat. Technol.
- Journal Page Range
- 139-142
- ISSN
- 0257-8972
- CODEN
- SCTEE
Conference
- Title
- 18. international conference on metallurgical coatings and thin films.
- Dates
- 22-26 Apr 1991.
- Place
- San Diego, CA (United States).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Switzerland
- INIS RN
- 23069849
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM; ARGON IONS; DEPOSITS; ELECTRON DIFFRACTION; ETCHING; GRAIN BOUNDARIES; GRAIN SIZE; ION BEAMS; IRON; LATTICE PARAMETERS; LAYERS; MAGNETIC FIELDS; MAGNETIC MOMENTS; MAGNETIC PROPERTIES; MAGNETIZATION; SPUTTERING; TRANSMISSION ELECTRON MICROSCO; VIBRATING SAMPLE MAGNETOMETERS; X-RAY DIFFRACTION
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; IONS; MAGNETOMETERS; MEASURING INSTRUMENTS; METALS; MICROSCOPY; MICROSTRUCTURE; PHYSICAL PROPERTIES; SCATTERING; SIZE; TRANSITION ELEMENTS