Published August 2011
| Version v1
Journal article
Evaluation of electron temperature fluctuations using two different probe techniques in Plasma Assembly for Nonlinear Turbulence Analysis (PANTA)
- 1. Kyushu University, Interdisciplinary Graduate School of Engineering Sciences, Fukuoka (Japan)
- 2. Kyushu University, Itoh Research Center for Plasma Turbulence, Fukuoka (Japan)
Description
Electron temperature fluctuations are measured with a rotatable triple probe in PANTA. Effects of fluctuation phase are cancelled by aligning the probe pins in the propagation direction of fluctuations. Evaluated electron temperature fluctuations normalized by average electron temperature are much smaller than normalized density fluctuations and normalized floating potential fluctuations in low electron temperature PANTA plasma. Additionally conditional sampling technique is applied to a single probe measurement. (author)
Availability note (English)
Available from http://dx.doi.org/10.1585/pfr.6.2406118Additional details
Identifiers
Publishing Information
- Journal Title
- Plasma and Fusion Research
- Journal Volume
- 6
- Journal Issue
- special issue 1
- Journal Page Range
- p. 2406118.1-2406118.4
- ISSN
- 1880-6821
Conference
- Title
- 20. international Toki conference on the next twenty years in plasma and fusion science
- Acronym
- ITC20
- Dates
- 7-10 Dec 2010
- Place
- Toki, Gifu (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 46064517
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRON TEMPERATURE; FLUCTUATIONS; FOURIER ANALYSIS; FREQUENCY ANALYSIS; LANGMUIR PROBE; NONLINEAR PROBLEMS; NORMAL-MODE ANALYSIS; PLASMA; PLASMA DIAGNOSTICS; PLASMA POTENTIAL; TURBULENCE; TURBULENT FLOW
- Descriptors DEC
- ELECTRIC POTENTIAL; ELECTRIC PROBES; FLUID FLOW; PROBES; VARIATIONS
Optional Information
- Notes
- 6 refs., 7 figs.