Published July 25, 2009 | Version v1
Journal article

Microstructure, thermophysical and electrical properties in AlxCoCrFeNi (0 ≤ x ≤2) high-entropy alloys

  • 1. Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan (China)
  • 2. Center for Nanotechnology, Materials Science, and Microsystems, National Tsing Hua University, Hsinchu 30013, Taiwan (China)

Description

AlxCoCrFeNi (0 ≤ x ≤2) alloys were prepared by an arc remelter and investigated. With increasing x, the AlxCoCrFeNi alloys change from single FCC phase to single BCC phase with a transition duplex FCC/BCC region. The weak X-ray diffraction intensities indicate severe X-ray scattering effect of lattice in these high-entropy alloys. Electrical conductivity and thermal conductivity much smaller than those of pure component metals is ascribed as due to this lattice effect. The behavior of electrical conductivity and thermal conductivity can be divided into three parts according to microstructure. Both values of electrical conductivity and thermal conductivity decrease with increasing x in single-phase regions. Values of electrical conductivity and thermal conductivity are even higher than those in the duplex phase region because of the additional scattering effect of FCC/BCC phase boundaries in the alloys. Relative contribution of electron and phonon to electrical resistivity and thermal conductivity is evaluated in this study. It is shown that both electron and phonon components are comparable in these high-entropy alloys, and their transport properties are similar to that of semi-metal.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.mseb.2009.05.024

Additional details

Identifiers

DOI
10.1016/j.mseb.2009.05.024;
PII
S0921-5107(09)00243-8;

Publishing Information

Journal Title
Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
Journal Volume
163
Journal Issue
3
Journal Page Range
p. 184-189
ISSN
0921-5107
CODEN
MSBTEK

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.