Published 1988
| Version v1
Miscellaneous
Development of a laser ion source for xenon
Creators
Description
An ion source for xenon has been developed based on resonant laser ionization of xenon atoms. The source combines high sensitivity with chemical selectivity. The values for the sensitivity and selectivity obtained are 2.5x10-4 Amp/Torr and 40, respectively. The latter value is a lower limit. This ion source is now implemented into a time of flight mass spectrometer. (orig.)
Additional details
Additional titles
- Original title (German)
- Entwicklung einer Laser-Ionenquelle fuer Xenon
Publishing Information
- Imprint Title
- Max-Planck-Institute for Nuclear Physics. Annual report 1987
- Imprint Pagination
- 202 p.
- Journal Page Range
- p. 158.
- Report number
- INIS-mf--12013
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 21007627
- Subject category
- S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- EFFICIENCY; ION SOURCES; LASER RADIATION; PHOTOIONIZATION; PHOTON-ATOM COLLISIONS; RESONANCE; SENSITIVITY; TIME-OF-FLIGHT MASS SPECTROMET; XENON; XENON IONS
- Descriptors DEC
- ATOM COLLISIONS; CHARGED PARTICLES; COLLISIONS; DYNAMIC MASS SPECTROMETERS; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZATION; IONS; MASS SPECTROMETERS; MEASURING INSTRUMENTS; NONMETALS; PHOTON COLLISIONS; RADIATIONS; RARE GASES; SPECTROMETERS; TIME-OF-FLIGHT SPECTROMETERS
Optional Information
- Notes
- Imprint:Max-Planck-Institut fuer Kernphysik. Jahresbericht 1987.