Comparative Study of Activity of Different Agings of Aluminum Nanopowders
Creators
- 1. Key Laboratory of Western Mine Exploitation and Hazard Prevention of the Ministry of Education, Xi'an University of Science and Technology, Xi'an 710054 (China)
- 2. College of Science, Xi'an University of Science and Technology, Xi'an 710054 (China)
Description
The structure and activity of aluminum nanopowders with a 3 nm oxide layer on their surface (3-nm-OLA) and 30 nm oxide layers on their surface (30-nm-OLA) are investigated comparably under the same normal incident shock wave intensity. Their corresponding reaction products are characterized by x-ray diffraction, high-resolution transmission electron microscopy and x-ray photoelectron spectroscopy. The spectrum of x-ray diffraction shows that there are different phases of alumina in their products, which evidences directly the different reacting temperature in the shock tube. The x-ray photoelectron spectroscopy reveals that the oxide layer thickness is 30 nm on the product surface of 30-nm-OLA, while it is only 3 nm on 3-nm-OLA. Images of transmission electron microscopy present additional evidence that the agglomeration mechanism is over sintering one in the containing-30-nm-OLA system, the reversed mechanism is observed in the containing-3-nm-OLA reaction system. (condensed matter: structure, mechanical and thermal properties)
Availability note (English)
Available from http://dx.doi.org/10.1088/0256-307X/26/8/086101Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics Letters
- Journal Volume
- 26
- Journal Issue
- 8
- Journal Page Range
- [3 p.]
- ISSN
- 0256-307X
- CODEN
- CPLEEU
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45000701
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- AGGLOMERATION; ALUMINIUM; ALUMINIUM OXIDES; LAYERS; NANOSTRUCTURES; POWDERS; SHOCK WAVES; SINTERING; SURFACES; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; FABRICATION; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SCATTERING; SPECTROSCOPY