Published May 2011
| Version v1
Journal article
Twinning mechanism via synchronized activation of partial dislocations in face-centered-cubic materials
Creators
- 1. Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016 (China)
- 2. Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, MD 21218 (United States)
- 3. Institute of Microstructure and Properties of Advanced Materials, Beijing University of Technology, Beijing 100124 (China)
Description
In situ straining in a high-resolution transmission electron microscope and molecular dynamics simulations reveal a new deformation twinning mechanism in the face-centered-cubic structure. A twin forms via the simultaneous and cooperative activation of different Shockley partial dislocations on three (1 1 1) layers. The synchronized slip produces a zero net Burgers vector; such twining relieves local stress concentration in a shear confined to adjacent atomic layers, but induces no macroscopic shape change of the surrounding crystal.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2011.01.016Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2011.01.016;
- PII
- S1359-6462(11)00017-0;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 64
- Journal Issue
- 9
- Journal Page Range
- p. 852-855
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45024537
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BURGERS VECTOR; CONCENTRATION RATIO; CRYSTALS; DEFORMATION; DISLOCATIONS; FCC LATTICES; LAYERS; MOLECULAR DYNAMICS METHOD; SHEAR; SLIP; STRAINS; STRESSES; TRANSMISSION ELECTRON MICROSCOPY; TWINNING
- Descriptors DEC
- CALCULATION METHODS; CRYSTAL DEFECTS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; DIMENSIONLESS NUMBERS; ELECTRON MICROSCOPY; LINE DEFECTS; MICROSCOPY
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.