The application of fundamental parameters method in EDXRF based on SDD
Creators
- 1. Applied Nuclear Techniques in Geoscience Key Laboratory of Sichuan Proviance, Chengdu University of Technology, Chengdu (China)
- 2. State Key Laboratory of Geohazard Prevention and Geoenvironment Protection, Chengdu (China)
Description
It created the FP mathematical analysis model in order to use EDXRF technique to analyze element contents without sample and gained the key parameters of the model such as mass-absorption coefficients and excitation factors. In experiment, two kinds of pseudobinary system containing Fe-Cu and Fe-Ti were analyzed with an energy dispersive X-ray analyzer based on a SDD and each element's content of the samples were calculated via the FP calculation procedure, the deviation of the accuracy is no more than 0.8% and the lowest relative error between calculated value and actual value is 2%. The result shows the FP method can overcome the absorption and enhancement effects between elements and apply to SDD-EDXRF analysis process well with no sample. (authors)
Additional details
Publishing Information
- Journal Title
- Nuclear Electronics and Detection Technology
- Journal Volume
- 32
- Journal Issue
- 9
- Journal Page Range
- p. 1096-1099, 1104
- ISSN
- 0258-0934
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 49053913
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ABSORPTION; ACCURACY; DATA; EXCITATION; X RADIATION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ENERGY-LEVEL TRANSITIONS; INFORMATION; IONIZING RADIATIONS; NONDESTRUCTIVE ANALYSIS; RADIATIONS; SORPTION; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 6 tabs., 25 refs.