Relativistic electron diffraction at the UCLA Pegasus photoinjector laboratory
Creators
- 1. UCLA Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA 90095-1547 (United States)
Description
Electron diffraction holds the promise to yield real-time resolution of atomic motion in an easily accessible environment like a university laboratory at a fraction of the cost of fourth-generation X-ray sources. Currently the limit in time-resolution for conventional electron diffraction is set by how short an electron pulse can be made. A very promising solution to maintain the highest possible beam intensity without excessive pulse broadening from space charge effects is to increase the electron energy to the MeV level where relativistic effects significantly reduce the space charge forces. Rf photoinjectors can in principle deliver up to 107-108 electrons packed in bunches of ∼100-fs length, allowing an unprecedented time resolution and enabling the study of irreversible phenomena by single-shot diffraction patterns. The use of rf photoinjectors as sources for ultrafast electron diffraction has been recently at the center of various theoretical and experimental studies. The UCLA Pegasus laboratory, commissioned in early 2007 as an advanced photoinjector facility, is the only operating system in the country, which has recently demonstrated electron diffraction using a relativistic beam from an rf photoinjector. Due to the use of a state-of-the-art ultrashort photoinjector driver laser system, the beam has been measured to be sub-100-fs long, at least a factor of 5 better than what measured in previous relativistic electron diffraction setups. Moreover, diffraction patterns from various metal targets (titanium and aluminum) have been obtained using the Pegasus beam. One of the main laboratory goals in the near future is to fully develop the rf photoinjector-based ultrafast electron diffraction technique with particular attention to the optimization of the working point of the photoinjector in a low-charge ultrashort pulse regime, and to the development of suitable beam diagnostics
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2008.03.011Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2008.03.011;
- PII
- S0304-3991(08)00180-0;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 108
- Journal Issue
- 11
- Journal Page Range
- p. 1450-1453
- ISSN
- 0304-3991
- CODEN
- ULTRD6
Conference
- Title
- 11. conference on frontiers of electron microscopy in materials science
- Dates
- 24-28 Sep 2007
- Place
- Sonoma, CA (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40006244
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM; ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRONS; LASERS; MEV RANGE; OPTIMIZATION; PULSES; RELATIVISTIC RANGE; SPACE CHARGE; TIME RESOLUTION; TITANIUM; UCLA; X-RAY SOURCES
- Descriptors DEC
- BEAMS; COHERENT SCATTERING; DIFFRACTION; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; FERMIONS; LEPTON BEAMS; LEPTONS; METALS; PARTICLE BEAMS; RADIATION SOURCES; RESOLUTION; SCATTERING; TIMING PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.