Published February 28, 2000
| Version v1
Journal article
Inelastic scattering of synchrotron radiation from electrons and nuclei for lattice dynamics studies
- 1. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60540 (United States)
Description
The inelastic scattering of x-rays, one of the the first applications of x-rays to the field of condensed matter physics, has been rejuvenated in the last decade. The availability of synchrotron radiation from wiggler and undulator sources combined with advances in monochromatization of the incident beam and analysis of the scattered beam with meV resolution led to the measurement of phonon dispersion relations. In addition, the use of Mossbauer nuclei as scatterer and analyzers has led to the discovery of the inelastic nuclear resonant scattering technique. This new method allows extraction of partial phonon density of states from amorphous materials, thin films, multilayers and interfaces, and liquids
Additional details
Identifiers
- DOI
- 10.1063/1.1303862;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 506
- Journal Issue
- 1
- Journal Page Range
- p. 479-485
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 18. international conference on X-ray and inner-shell processes
- Dates
- 23-27 Aug 1999
- Place
- Chicago, IL (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34067573
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- AMORPHOUS STATE; DISPERSION RELATIONS; ENERGY LEVELS; EXPERIMENTAL DATA; INELASTIC SCATTERING; INTERFACES; LATTICE VIBRATIONS; PHONONS; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DATA; DIFFRACTION; FILMS; INFORMATION; NUMERICAL DATA; QUASI PARTICLES; SCATTERING
Optional Information
- Contract/Grant/Project number
- Contract no. W-31109-ENG-38
- Notes
- (c) 2000 American Institute of Physics.