Published February 8, 2012 | Version v1
Journal article Metadata-only

Demonstration of optical thickness measurement using multilayer cold neutron interferometer

Creators

  • 1. RIKEN, Wako, Saitama 351-0198 (Japan)
  • 2. Institute for the Promotion of Excellence in Higher Education, Kyoto University, Kyoto 606-8501 (Japan)
  • 3. Research Reactor Institute, Kyoto University, Kumatori, Osaka 590-0494 (Japan)
  • 4. KEK, Tsukuba, Ibaraki 305-0801 (Japan)

Description

We have measured the optical thickness of a phase object for the first time using multilayer cold neutron interferometer. The measured phase shift of 15.1 ± 1.9 wavelength agreed with the expected value of 17.4 ± 0.7 wavelength due to an about 600-μm-thick silicon plate. This demonstration reconfirmed that two paths in our new interferometer were completely separate, and showed its applicability into various precise measurements.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/340/1/012039

Additional details

Identifiers

DOI
10.1088/1742-6596/340/1/012039;

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
340
Journal Issue
1
Journal Page Range
[5 p.]
ISSN
1742-6596

Conference

Title
5. european conference on neutron scattering
Dates
17-21 Jul 2011
Place
Prague (Czech Republic)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43101127
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COLD NEUTRONS; INTERFEROMETERS; LAYERS; NEUTRON DIFFRACTION; NEUTRON DIFFRACTOMETERS; PHASE SHIFT; PLATES; SILICON; THICKNESS; WAVELENGTHS
Descriptors DEC
BARYONS; COHERENT SCATTERING; DIFFRACTION; DIFFRACTOMETERS; DIMENSIONS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; HADRONS; MEASURING INSTRUMENTS; NEUTRONS; NUCLEONS; SCATTERING; SEMIMETALS