Published June 30, 2003
| Version v1
Journal article
Adsorption of Si atom on H-terminated Si(0 0 1)-2 x 1 surface
Description
Adsorption and diffusion of Si atoms on a hydrogen-terminated Si(0 0 1)-2x1 surface is studied using scanning tunneling microscopy/spectroscopy and first-principles total-energy calculations. We find that the Si atoms randomly adsorb at the bridge site of Si dimers forming SiH2 clusters at room temperature, and move into the off-centred inter-bridge site after annealing at 250 deg. C
Additional details
Identifiers
- DOI
- 10.1016/S0169-4332(03)00481-1;
- arXiv
- arXiv:astro-ph/9605147v2;
- PII
- S0169433203004811;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 216
- Journal Issue
- 1-4
- Journal Page Range
- p. 15-18
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 4. international symposium on the control of semiconductor interfaces
- Dates
- 21-25 Oct 2002
- Place
- Karuizawa (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38086723
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ADSORPTION; ANNEALING; DIFFUSION; DIMERS; HYDROGEN; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACES; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K
- Descriptors DEC
- ELEMENTS; HEAT TREATMENTS; MICROSCOPY; NONMETALS; SEMIMETALS; SORPTION; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.