Published June 30, 2003 | Version v1
Journal article

Adsorption of Si atom on H-terminated Si(0 0 1)-2 x 1 surface

Description

Adsorption and diffusion of Si atoms on a hydrogen-terminated Si(0 0 1)-2x1 surface is studied using scanning tunneling microscopy/spectroscopy and first-principles total-energy calculations. We find that the Si atoms randomly adsorb at the bridge site of Si dimers forming SiH2 clusters at room temperature, and move into the off-centred inter-bridge site after annealing at 250 deg. C

Additional details

Identifiers

DOI
10.1016/S0169-4332(03)00481-1;
arXiv
arXiv:astro-ph/9605147v2;
PII
S0169433203004811;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
216
Journal Issue
1-4
Journal Page Range
p. 15-18
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
4. international symposium on the control of semiconductor interfaces
Dates
21-25 Oct 2002
Place
Karuizawa (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38086723
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ADSORPTION; ANNEALING; DIFFUSION; DIMERS; HYDROGEN; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACES; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K
Descriptors DEC
ELEMENTS; HEAT TREATMENTS; MICROSCOPY; NONMETALS; SEMIMETALS; SORPTION; TEMPERATURE RANGE

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.