Published May 1987 | Version v1
Journal article

The roles of different excision-repair mechanisms in the resistance of Micrococcus luteus to UV and chemical mutagens

  • 1. Kyoto Univ. (Japan). Faculty of Science

Description

M. luteus mutants showing increased sensitivity to both UV and 4-NQO were isolated after the treatment of parental ATCC4698 strain with MNNG. The mutants were also highly sensitive to mitomycin C, cis-platinum, 8-methoxypsoralen (8-MOP) plus near-UV and angelicin plus near-UV in various degrees. With regard to host-cell reactivation ability the mutants fell into two groups. The hcr- mutants lacked the ability to reactivate UV-damaged N6 phage and were resistant to X-rays. The incision of DNA did not occur during incubation after the treatment with angelicin plus near-UV in the hcr- mutants, whereas it occurred in the parental strain. The facts indicate that the hcr- mutants are defective in the incision mechanism which has a wide substrate specificity, similar to the UVRABC nuclease of E. coli. On the other hand, the incision of DNA and the removal of UV-induced thymine dimers from DNA occurred in the hcr- mutants as well as in the parental strain, which is ascribed to the UV endonuclease activity. (Auth.)

Additional details

Publishing Information

Journal Title
Mutat. Res., DNA Repair Rep.
Journal Volume
183
Journal Issue
3
Series
Mutat. Res., DNA Repair Rep.
Journal Page Range
231-239
ISSN
0167-8817
CODEN
MUREA

Optional Information

Notes
28 refs.; 7 figs.; 1 table.