Published March 15, 1994 | Version v1
Journal article Metadata-only

Studies of a double-sided silicon microstrip system with analog VLSI readout

Creators

  • 1. Dept. of Physics and Astronomy, Univ. of Oklahoma, Norman, OK (United States)
  • 2. Dept. of Physics, Yale Univ., New Haven, CT (United States)
  • 3. Dept. of Physics, Univ. of Iowa, Iowa City, IA (United States)

Description

The tracking performance of a 0.64 cm square double-sided AC-coupled detector manufactured by Hamamatsu Photonics Inc. has been evaluated in a test beam of 227 GeV/c pions at Fermilab. The detector was fabricated with 50 μm pitch on the ohmic (n) side and 25 μm pitch on the diode (p) side. Readout pitch for both sides was 50 μm and was implemented with a Berkeley designed SVX-D IC/SRS/SDA sequencer system. Measurements were made of signal-to-noise, charge correlation characteristics and resolution vs. angle of incidence in the range from 0 to 60 with analog pulse height information. Measurements were made at room temperature, -12 C and -20 C. (orig.)

Additional details

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
342
Journal Issue
1
Journal Page Range
p. 264-268.
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
1. international symposium on development and application of semiconductor tracking detectors (Hiroshima STD Symposium).
Dates
22-24 May 1993.
Place
Hiroshima (Japan).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
25056085
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALTERNATING CURRENT; ANALOG SYSTEMS; CORRELATIONS; COUPLING; GEV RANGE 100-1000; INTEGRATED CIRCUITS; PARTICLE TRACKS; PION DETECTION; POSITION SENSITIVE DETECTORS; PULSES; READOUT SYSTEMS; RELATIVISTIC RANGE; SI SEMICONDUCTOR DETECTORS; SIGNAL-TO-NOISE RATIO; SPATIAL RESOLUTION; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0065-0273 K; TEMPERATURE RANGE 0273-0400 K
Descriptors DEC
CURRENTS; DETECTION; ELECTRIC CURRENTS; ELECTRONIC CIRCUITS; ENERGY RANGE; GEV RANGE; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; TEMPERATURE RANGE