Enhanced ODR range using exponentially graded refractive index profile of 1D binary photonic crystal
- 1. Department of Physics, Gurukul Kangri Vishwavidyalaya Haridwar, Uttarakhand, India, PIN-249404 (India)
- 2. Department of Physics, D.J. College Baraut, Uttar Pradesh, India, PIN –250611 (India)
- 3. Department of Physics S.K.K.J.(P.G) College Khatauli, Muzaffarnagar, Uttar Pradesh, India, Pin-251201 (India)
- 4. AITEM, Amity University, Noida (India)
Description
A simple design of broadband one dimensional dielectric/semiconductor multilayer structure having refractive index profile of exponentially graded material has been proposed. The theoretical analysis shows that the proposed structure works as a perfect mirror within a certain wavelength range (1550 nm). In order to calculate the reflection properties a transfer matrix method (TMM) has been used. This property shows that binary graded photonic crystal structures have widened omnidirectional reflector (ODR) bandgap. Hence a exponentially graded photonic crystal structure can be used as a broadband optical reflector and the range of reflection can be tuned to any wavelength region by varying the refractive index profile of exponentially graded photonic crystal structure.
Additional details
Identifiers
- DOI
- 10.1063/1.4946718;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1728
- Journal Issue
- 1
- Journal Page Range
- vp.
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- International conference on condensed matter and applied physics
- Acronym
- ICC 2015
- Dates
- 30-31 Oct 2015
- Place
- Bikaner (India)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48052402
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTAL STRUCTURE; CRYSTALS; DIELECTRIC MATERIALS; LAYERS; ONE-DIMENSIONAL CALCULATIONS; REFLECTION; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS; TRANSFER MATRIX METHOD; WAVELENGTHS
- Descriptors DEC
- CALCULATION METHODS; MATERIALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES
Optional Information
- Notes
- (c) 2016 Author(s)