Published May 6, 2016 | Version v1
Journal article

Enhanced ODR range using exponentially graded refractive index profile of 1D binary photonic crystal

  • 1. Department of Physics, Gurukul Kangri Vishwavidyalaya Haridwar, Uttarakhand, India, PIN-249404 (India)
  • 2. Department of Physics, D.J. College Baraut, Uttar Pradesh, India, PIN –250611 (India)
  • 3. Department of Physics S.K.K.J.(P.G) College Khatauli, Muzaffarnagar, Uttar Pradesh, India, Pin-251201 (India)
  • 4. AITEM, Amity University, Noida (India)

Description

A simple design of broadband one dimensional dielectric/semiconductor multilayer structure having refractive index profile of exponentially graded material has been proposed. The theoretical analysis shows that the proposed structure works as a perfect mirror within a certain wavelength range (1550 nm). In order to calculate the reflection properties a transfer matrix method (TMM) has been used. This property shows that binary graded photonic crystal structures have widened omnidirectional reflector (ODR) bandgap. Hence a exponentially graded photonic crystal structure can be used as a broadband optical reflector and the range of reflection can be tuned to any wavelength region by varying the refractive index profile of exponentially graded photonic crystal structure.

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1728
Journal Issue
1
Journal Page Range
vp.
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
International conference on condensed matter and applied physics
Acronym
ICC 2015
Dates
30-31 Oct 2015
Place
Bikaner (India)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48052402
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTAL STRUCTURE; CRYSTALS; DIELECTRIC MATERIALS; LAYERS; ONE-DIMENSIONAL CALCULATIONS; REFLECTION; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS; TRANSFER MATRIX METHOD; WAVELENGTHS
Descriptors DEC
CALCULATION METHODS; MATERIALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES

Optional Information

Notes
(c) 2016 Author(s)