In-situ doping of erbium in hydrogenated amorphous carbon by low temperature metalorganic radio frequency plasma enhanced chemical vapor deposition
Creators
- 1. Department of Electrical and Computer Engineering, University of Toronto, ON M5S 3G4 (Canada)
- 2. Department of Electrophysics, National Chiao Tung University, Hsinchu 30010, Taiwan (China)
- 3. Centre for Interdisciplinary Science, National Chiao Tung University, Hsinchu 30010, Taiwan (China)
- 4. Department of Materials Science and Engineering, I-Shou University, Kaohsiung 84001, Taiwan (China)
- 5. Department of Materials Science and Engineering, University of Toronto, ON M5S 3E4 (Canada)
Description
A significant improvement in the photoluminescence of erbium doped amorphous carbon (a-C:H(Er)) is reported. The effects of the RF power on the anode and cathode a-C:H films were investigated in terms of the microstructural and local bonding features. It was determined that Er doped a-C:H films should be placed on the anode to obtain wider bandgap and lower percentage of sp2 carbon bonding. The metalorganic compound, tris(6,6,7,7,8,8,8-heptafluoro-2,2-dimethyl-3,5-octanedionate) Erbium(+ III) or Er(fod)3, was incorporated in-situ into an a-C:H host by metalorganic rf plasma enhanced chemical vapor deposition. This technique provides the capability of doping Er in a vertically uniform profile. The high erbium concentration (3.9 at.%), partial fluorination of the surrounding ligands, and the large optical bandgap of the host a-C:H are the primary factors that enable enhancement of the photoluminescence. - Highlights: • High and uniform Er concentration (3.9 at.%) in a-C:H(Er) films is achieved. • Room-temperature photoluminescence peaking at 1.54 μm is demonstrated. • Optically active Er3+ ions are preserved in as-grown samples at low growth temperature. • Non-radiative C-H vibrational quenching is reduced by fluorination of a-C host. • Metalorganic-RF-PECVD provides the potential of doping Er in vertically uniform profiles
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2014.02.038Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2014.02.038;
- PII
- S0040-6090(14)00173-4;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 570
- Journal Issue
- Part B
- Journal Page Range
- p. 429-435
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- International thin films conference
- Acronym
- TACT 2013
- Dates
- 5-9 Oct 2013
- Place
- Taipei, Taiwan (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47004289
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARBON; CHEMICAL VAPOR DEPOSITION; CONCENTRATION RATIO; DOPED MATERIALS; ERBIUM; FLUORINATION; HYDROGENATION; LIGANDS; MICROSTRUCTURE; ORGANOMETALLIC COMPOUNDS; PHOTOLUMINESCENCE; PLASMA; RADIOWAVE RADIATION; TEMPERATURE DEPENDENCE; THIN FILMS
- Descriptors DEC
- CHEMICAL COATING; CHEMICAL REACTIONS; DEPOSITION; DIMENSIONLESS NUMBERS; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; FILMS; HALOGENATION; LUMINESCENCE; MATERIALS; METALS; NONMETALS; ORGANIC COMPOUNDS; PHOTON EMISSION; RADIATIONS; RARE EARTHS; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.