Published July 16, 2007 | Version v1
Journal article

Photodiodes based on fullerene semiconductor

  • 1. Micro and Nano Technology Group (MNT), Departament Enginyeria Electronica, Universitat Politecnica Catalunya, c/ Jordi Girona 1-3 Campus Nord C4, 08034-Barcelona (Spain)
  • 2. ICFO- Institut de Ciencies Fotoniques, Mediterranean Technology Park, Av. del Canal Olimpic s/n, 08860-Castelldefels (Spain)
  • 3. Solar Energy Group, Departament Fisica Aplicada i Optica, Universitat de Barcelona, Avda. Diagonal 647, 08028-Barcelona (Spain)

Description

Fullerene thin films have been deposited by thermal evaporation on glass substrates at room temperature. A comprehensive optical characterization was performed, including low-level optical absorption measured by photothermal deflection spectroscopy. The optical absorption spectrum reveals a direct bandgap of 2.3 eV and absorption bands at 2.8 and 3.6 eV, which are related to the creation of charge-transfer excitons. Various photodiodes on indium-tin-oxide coated glass substrates were also fabricated, using different metallic contacts in order to compare their respective electrical characteristics. The influence of a poly(3,4-ethylenedioxythiophene) poly(styrenesulfonate) buffer layer between the indium-tin-oxide electrode and the fullerene semiconductor is also demonstrated. These results are discussed in terms of the workfunction for each electrode. Finally, the behaviour of the external quantum efficiency is analyzed for the whole wavelength spectrum

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2006.11.160

Additional details

Identifiers

DOI
10.1016/j.tsf.2006.11.160;
PII
S0040-6090(06)01458-1;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
515
Journal Issue
19
Journal Page Range
p. 7675-7678
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
Symposium I on thin films for large area electronics EMRS 2007 conference
Acronym
EMRS 2006 - Symposium J
Dates
29 May - 2 Jun 2006
Place
Nice (France)

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.