Crystal structure, morphology and magnetic properties of nanocrystalline Zr${}_6$Fe${}_{23}$ thin films grown on Si(001) substrate

In this paper, crystal structure, morphology and magnetic properties of nanocrystalline Zr${}_6$Fe${}_{23}$ thin films have been reported. Zr${}_6$Fe${}_{23}$ films with different thickness X were grown by RF magnetron sputtering onto Si(001) substrate. The X thickness varies from 18 to 500 nm. From grazing X-ray diffraction patterns (GIXRD), the Zr${}_6$Fe${}_{23}$/Si(001) films have a single phase with cubic structure Th${}_6$Mn${}_{23}$ type (Fm-3m space group) structure. We showed the presence of a strong preferred orientation (4 4 0) for X between 18 and 402 nm. However, for higher thicknesses X $\ge$ 402 nm, multiple peaks are observed show the polycrystalline nature of the films and textured along (4 4 2), (5 3 3) and (6 6 0) orientations. The magnetic properties were affected by the thickness due to the morphology, roughness R${}_{rms}$ and intergrain exchange coupling (IEC). The correlations between these properties are investigated using the magnetic force microscopy (MFM) analysis. The 200 nm-thick Zr${}_6$Fe${}_{23}$/Si(001) film showed a high coercivity H${}_c$ = 3580 Oe, maximum energy product (BH)${}_{max}$ of 2.45 MGOe, magnetic anisotropy field (H${}_a$ = 11230 Oe and Curie temperature T${}_C$$\simeq$ 821 K. The results found in this work could potentially pave the way for the future exploration and of magnetic recording development or spintronic devices made from nanocrystalline Zr${}_6$Fe${}_{23}$ films.