Published 1976
| Version v1
Report
Reliability control on semiconductor components
Description
More and more, reliability is an economic factor, too. The costs of maintenance and other risks are mainly based on the MBFT (mean time between failure) value and with it on the failure rates of the individual components. The measures necessay to improve the MBFT, like use of redundant systems, concepts of maintenance, or choice of components with increased reliability are mostly determined by cost aspects. (RW)
Abstract (German)
Zuverlaessigkeit ist in zunehmendem Masse auch ein Wirtschaftlichkeitsfaktor. Wartungskosten und sonstige Risiken basieren vorwiegend auf dem MBFT (mean time between failure) Wert und damit auf den Ausfallraten der einzelnen Bauelemente. Vorwiegend Kostengesichtspunkte bestimmen die notwendigen Massnahmen zur Verbesserung der MBFT, wie Einsatz redundanter Systeme, Wartungskonzepte oder Wahl von Bauelementen erhoehter Zuverlaessigkeit. (RW)Additional details
Additional titles
- Original title (German)
- Zuverlaessigkeitssicherung bei Halbleiterbauelementen
Publishing Information
- Imprint Title
- Seminar on reliability assurance and quality testing in electronics
- Imprint Pagination
- vp.
- Report number
- AED-Conf--76-551-000
Conference
- Title
- Seminar on reliability assurance and quality testing in electronics.
- Dates
- 23 Nov 1976.
- Place
- Muenchen, Germany, F.R.
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 8313490
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AVAILABILITY; COST; COST BENEFIT ANALYSIS; ECONOMICS; QUALITY ASSURANCE; RELIABILITY; REPAIR; SEMICONDUCTOR DEVICES; SYSTEM FAILURE ANALYSIS
- Descriptors DEC
- SYSTEMS ANALYSIS
Optional Information
- Notes
- 5 figs.; 2 tabs.; 10 refs. Imprint:Seminar ueber Zuverlaessigkeitssicherung und Qualitaetspruefung in der Elektronik.
- Secondary number(s)
- AED-Conf--76-551-008.