Published August 1, 2009 | Version v1
Journal article

Nano-engineered ultra-high-gain microchannel plates

  • 1. Arradiance, Inc., 142 North Road, Sudbury, MA 01776 (United States)

Description

Highly localized and very fast electron amplification of microchannel plates (MCPs) enables a large number of high-resolution and high-sensitivity detection technologies, which provide spatial and/or temporal information for each detected photon/electron/ion/neutron. Although there has been significant progress in photocathode and readout technologies the MCPs themselves have not evolved much from the technology developed several decades ago. Substantial increases in the gain of existing MCP technology have been accomplished by utilizing state-of-the-art processes developed for nano-engineered structures. The gain of treated MCPs with aspect ratio of 40:1 is reproducibly measured to reach unprecedented values of 2x105. This gain enhancement is shown to be stable during MCP operation. In addition, the initial experiments indicate improved stability of gain as a function of extracted charge and MCP storage conditions. We also present results from a fully independent thin-film process for manufacturing non-lead glass MCPs using engineered thin films for both the resistive and emissive layers. These substrate-independent MCPs show high gain, less gain degradation with extracted charge, and greater pore-to-pore and plate-to-plate uniformity than has been possible with conventional lead glass structures.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2009.03.134

Additional details

Identifiers

DOI
10.1016/j.nima.2009.03.134;
PII
S0168-9002(09)00609-3;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
607
Journal Issue
1
Journal Page Range
p. 81-84
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
10.international workshop on radiation imaging detectors
Dates
29 Jun - 3 Jul 2008
Place
Helsinki (Finland)

INIS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.