Published July 21, 2001
| Version v1
Journal article
Reflectivity studies on a synchrotron radiation mirror in the hard X-ray regime
Description
The optical performance and roughness parameters of an X-ray mirror that was used for several years in a synchrotron radiation beamline are determined by studying its X-ray reflectivity and diffuse scattering behavior. These values are compared to the data derived from topographic measurements with an atomic force microscope (AFM)
Additional details
Identifiers
- PII
- S0168900201003047;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 467-468
- Journal Issue
- 1-2
- Journal Page Range
- p. 275-278
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Germany
- INIS RN
- 34023487
- Subject category
- S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- BEAM TRANSPORT; BRAGG REFLECTION; HARD X RADIATION; MIRRORS; PHOTON BEAMS; PHOTON COLLISIONS; REFLECTIVITY; ROUGHNESS; SCATTERING; SYNCHROTRON RADIATION; X-RAY EQUIPMENT
- Descriptors DEC
- BEAMS; BREMSSTRAHLUNG; COLLISIONS; ELECTROMAGNETIC RADIATION; EQUIPMENT; IONIZING RADIATIONS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; REFLECTION; SURFACE PROPERTIES; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.